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Energy Research Abstracts

Energy Research Abstracts PDF

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Size: 20.67 MB
Format: PDF, ePub, Docs
Category : Power resources
Languages : en
Pages :
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Book Description:

Physics Briefs

Physics Briefs PDF

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Size: 47.73 MB
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Category : Physics
Languages : en
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Ultrafast Phenomena In Semiconductors

Ultrafast Phenomena in Semiconductors PDF

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Author: David K. Ferry
Publisher: Society of Photo Optical
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Size: 54.24 MB
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Category : Science
Languages : en
Pages : 378
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PDF

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Author: 国立国会図書館 (Japan)
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Size: 21.85 MB
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Category : Science
Languages : en
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Uspekhi Fizicheskikh Nauk

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Size: 80.52 MB
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Category : Physics
Languages : ru
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Optical Characterization Of Semiconductors

Optical Characterization of Semiconductors PDF

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Author: Sidney Perkowitz
Publisher:
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Size: 64.77 MB
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Category : Semiconductors
Languages : en
Pages : 220
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Book Description: This is the first book to explain, illustrate, and compare the most widely used methods in optics: photoluminescence, infrared spectroscopy, and Raman scattering. Written with non-experts in mind, the book develops the background needed to understand the why and how of each technique, but does not require special knowledge of semiconductors or optics. Each method is illustrated with numerous case studies. Practical information drawn from the authors experience is given to help establish optical facilities, including commercial sources for equipment, and experimental details. For industrial scientists with specific problems in semiconducting materials; for academic scientists who wish to apply their spectroscopic methods to characterization problems; and for students in solid state physics, materials science and engineering, and semiconductor electronics and photonics, this book provides a unique overview, bringing together these valuable techniques in a coherent wayfor the first time. Discusses and compares infrared, Raman, and photoluminescence methods Enables readers to choose the best method for a given problem Illustrates applications to help non-experts and industrial users, with answers to selected common problems Presents fundamentals with examples from the semiconductor literature without excessive abstract discussion Features equipment lists and discussion of techniques to help establish characterization laboratories

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